Thickness Measurement on Ti, Au, Pd, and Cr using PVD75 E-beam Evaporator
Loading...
Degree type
Discipline
Subject
Thickness
Ti
Au
Pd
Cr
Ti
Au
Pd
Cr
Funder
Grant number
Copyright date
Distributor
Related resources
Author
Contributor
Abstract
Advisor
Date Range for Data Collection (Start Date)
Date Range for Data Collection (End Date)
Digital Object Identifier
Series name and number
Publication date
2015-06-13