Nanoscale Optical Tomography using Volume-scanning Near-field Microscopy
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The relationship between sample structure and data in volume-scanning backscattering mode near-field optical microscopy is investigated. It is shown that the three-dimensional structure of a dielectric sample is encoded in the phase and amplitude of the scattered field and that an approximate reconstruction of the sample structure may be obtained.
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Suggested Citation: Sun, J., Schotland, J.C., Hillenbrand, R. and Carney, P.S. (2009). "Nanoscale optical tomography using volume-scanning near-field microscopy." Applied Physics Letters. 95, 121108. © 2009 American Institute of Physics. This article may be downloaded for personal use only. Any other use requires prior permission of the author and the American Institute of Physics. The following article appeared in Applied Physics Letters and may be found at http://dx.doi.org/10.1063/1.3224177.