Synthesis and characterization of smooth ultrananocrystalline diamond films via low pressure bias-enhanced nucleation and growth

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atomic force microscopy
diamond
heat treatment
nanostructured materials
nanotechnology
nucleation
transition electron microscopy
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Chen, Y. C
Zhong, X. Y
Konicek, A. R
Grierson, D. S
Tai, N. H
Lin, I. N
Kabius, Bernd
Hiller, Jon M
Sumant, A. V

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This letter describes the fundamental process underlying the synthesis of ultrananocrystalline diamond (UNCD) films, using a new low-pressure, heat-assisted bias-enhanced nucleation (BEN)/bias enhanced growth (BEG) technique, involving H2/CH4 gas chemistry. This growth process yields UNCD films similar to those produced by the Ar-rich/CH4 chemistries, with pure diamond nanograins (3–5 nm), but smoother surfaces (~6 nm rms) and higher growth rate (~1 µm/h). Synchrotron-based x-Ray absorption spectroscopy, atomic force microscopy, and transmission electron microscopy studies on the BEN-BEG UNCD films provided information critical to understanding the nucleation and growth mechanisms, and growth condition-nanostructure-property relationships.

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2008-04-02

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Reprinted from Applied Physics Letters, Volume 92, Article 133113, March 2008, 3 pages. Publisher URL: http://dx.doi.org/10.1063/1.2838303

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