6.3 - Grazing Incidence Scattering

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GIXS
GID
grazing incidence
Langmuir
Physics

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Abstract

Grazing incidence scattering, sometimes Grazing Incidence Diffraction (GID) or Grazing Incidence X-ray Scattering (GIXS) is used to probe the internal structure of thin films on solid or liquid substrates. Time 3:52.

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2016-08-15

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Videos 6.1-6.3 discuss scattering from interfaces or thin films deposited on substrates, including reflectivity and grazing incidence scattering. These videos are independently accessible without viewing those in previous sections.

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