Near-Field Scanning Optical Tomography: A Nondestructive Method for Three-Dimensional Nanoscale Imaging
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inverse problems
inverse scattering
microscopy
near-field optics
scanning probe microscopy
tomography
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We present the theoretical foundation for near-field scanning optical tomography, a method for three-dimensional optical imaging with subwavelength resolution. An analysis of the forward problem for both scalar and vector optical fields is described. This is followed by the construction of the pseudoinverse solution to the linearized inverse scattering problem. The results are illustrated by numerical simulations.
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Copyright YEAR IEEE. Reprinted from IEEE Journal on Selected Topics in Quantum Electronics, Volume 12, Issue 6, December 2006, pages 1072-1082. This material is posted here with permission of the IEEE. Such permission of the IEEE does not in any way imply IEEE endorsement of any of the University of Pennsylvania's products or services. Internal or personal use of this material is permitted. However, permission to reprint/republish this material for advertising or promotional purposes or for creating new collective works for resale or redistribution must be obtained from the IEEE by writing to pubs-permissions@ieee.org. By choosing to view this document, you agree to all provisions of the copyright laws protecting it.