Rinaldi, MatteoZuniga, ChiaraPiazza, Gianluca2023-05-222023-05-222010-04-012010-09-29https://repository.upenn.edu/handle/20.500.14332/33768This paper reports on the design and experimental verification of a new class of ultra-thin-film (250 nm) aluminum nitride (AlN) microelectromechanical system (MEMS) contour mode resonators (CMRs) suitable for the fabrication of ultra-sensitive gravimetric sensors. The device thickness was opportunely scaled in order to increase the mass sensitivity, while keeping a constant frequency of operation. In this first demonstration the resonance frequency of the device was set to 178 MHz and a mass sensitivity as high as 38.96 KHz⋅μm2/fg was attained. This device demonstrates the unique capability of the CMR-S technology to decouple resonance frequency from mass sensitivity.gravimetric sensors; AlN contour-mode resonators; sensitivity; ultra-thin-film AlN.Acoustics, Dynamics, and ControlsElectrical and ElectronicsElectro-Mechanical SystemsElectronic Devices and Semiconductor ManufacturingNanoscience and NanotechnologyNanotechnology FabricationPresentation