Strachan, Douglas RDavies, Peter KJohnston, Danvers EBonnell, Dawn AGuitton, Beth SJohnson, Alan TDatta, Sujit S2023-05-232023-05-232008-02-082008-03-20https://repository.upenn.edu/handle/20.500.14332/40986We present real-time transmission electron microscopy of nanogap formation by feedback controlled electromigration that reveals a remarkable degree of crystalline order. Crystal facets appear during feedback controlled electromigration indicating a layer-by-layer, highly reproducible electromigration process avoiding thermal runaway and melting. These measurements provide insight into the electromigration induced failure mechanism in sub-20 nm size interconnects, indicating that the current density at failure increases as the width decreases to approximately 1 nm.molecular electronic deviceselectronic structure of nanoscale materialselectrical properties of metal-to-metal contactsnanoscale contacts (electronic transporArticle