Thickness Measurement on Ti, Au, Pd, and Cr using PVD75 E-beam Evaporator

Turakhia, Dhruv2023-05-232023-05-232015-06-132015-06-13https://repository.upenn.edu/handle/20.500.14332/45946http://creativecommons.org/licenses/by-sa/4.0/ThicknessTiAuPdCrThickness Measurement on Ti, Au, Pd, and Cr using PVD75 E-beam EvaporatorReport