Sun, JinSchotland, John CHillenbrand, RainerCarney, P. Scott2023-05-222023-05-222009-09-232010-11-30https://repository.upenn.edu/handle/20.500.14332/2843The relationship between sample structure and data in volume-scanning backscattering mode near-field optical microscopy is investigated. It is shown that the three-dimensional structure of a dielectric sample is encoded in the phase and amplitude of the scattered field and that an approximate reconstruction of the sample structure may be obtained.Biomedical Engineering and BioengineeringEngineeringArticle