Heiney, Paul A.2023-05-232017-03-062016-08-152017-03-06https://repository.upenn.edu/handle/20.500.14332/49697Grazing incidence scattering, sometimes Grazing Incidence Diffraction (GID) or Grazing Incidence X-ray Scattering (GIXS) is used to probe the internal structure of thin films on solid or liquid substrates. Time 3:52.youtubehttp://creativecommons.org/licenses/by-nc/4.0/GIXSGIDgrazing incidenceLangmuirPhysicsArticle