Schoonover, Robert WZysk, Adam MCarney, P. ScottSchotland, John CWolfe, Emil2023-05-222023-05-222008-04-012008-06-06https://repository.upenn.edu/handle/20.500.14332/2782A method is described which elucidates propagation of an electromagnetic field generated by a stochastic, electromagnetic source within the short wavelength limit. The results can be used to determine statistical properties of fields using ray tracing methods.light propagationray tracingArticle